Your ultra-fast, top surface measuring crystal orientation in a compact package, able to measure any single crystal with a diameter between 2 mm and 300 mm. SDCOM uses the azimuthal scan method for fast, precise, and reliable orientation measurements in both lab and production settings.
Industry: Semiconductor
Omega/Theta: Crystal orientation in just 10 seconds
The ultimate in precision and speed for crystal lattice orientation – only with us. Watch as Destiny Lopez, Application Specialist at Malvern Panalytical, demonstrates how quick and easy it is to take a single measurement on the Omega Theta instrument
Select your recipe. Start your measurement. Get crystal orientation and surface tilt information in just 10 seconds.
Also follow us on:
https://www.instagram.com/malvernpanalytical/
https://www.linkedin.com/company/malvernpanalytical
Ensuring precision of thin wafers
Lars Grieger, segment marketing manager, presents an overview of metrology in single crystal manufacturing from raw ingot to finished wafer. He describes the market drivers in the semiconductor industry and relevant applications in academia. Lars explains the capabilities of newly acquired instruments and the role they play in crystal manufacturing metrology. He summarizes the accessories and optical capabilities that enhance the key benefits of the new instruments.