When speed, precision, and versatility matter, DDCOM brings crystal orientation analysis to a whole new level. This ultra-fast X-ray diffraction system delivers crystal orientation measurements all in a compact, portable format designed for both research and production environments. In this demo, we showcase how DDCOM determines full lattice orientation with unmatched speed and accuracy—thanks to its Azimuthal scan method and bottom-up measurement geometry, enabling reliable results in just a few seconds. With pre-programmed crystal recipes, DDCOM is ideal for controlling cutting, grinding, and lapping processes with precision as fine as 1/100°.
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In semiconductor manufacturing and research, precision and speed are paramount for quality control. The Wafer XRD 200 is the ultimate X-ray diffraction system, providing ultra-fast, accurate crystal orientation measurements in just 10 seconds using the innovative Azimuthal scan method. This demo showcases the full capabilities of the Wafer XRD 200, including its fully automated sample handling, geometric feature recognition (notches, flats), and options for measuring resistivity, crystal lattice orientation, and more. Capable measuring all single crystalline materials, and processing up to 25 wafers in under 10 minutes, it seamlessly integrates into your production line with connectivity to MES and SECS/GEM interfaces. It offers reliable and in-depth measurements while maintaining low operating costs thanks to its energy-efficient air-cooled X-ray tube.
Determining crystal orientation is crucial in semiconductor production. The Omega/Theta is the solution to accomplish this step quickly and accurately . This X-ray diffractometer comes with fully automated vertical three-axes and features such as mapping and stacking stages, rocking curve capabilities and many more. By combining the Azimuthal scan method with flexible sample handling, the Omega/Theta XRD can provide full measurements for all single crystalline materials in as few as 10 seconds. In this Demo, we reveal the measurement procedures for different types of samples such as irregular single crystalline samples and wafer samples. The procedure is done with the help of the XRD Suite, both a powerful and intuitive software, making it convenient and easy to operate for a range of users.
Determining crystal orientation is crucial in semiconductor production. The Omega/Theta is the solution to accomplish this step quickly and accurately . This X-ray diffractometer comes with fully automated vertical three-axes and features such as mapping and stacking stages, rocking curve capabilities and many more. By combining the Azimuthal scan method with flexible sample handling, the Omega/Theta XRD can provide full measurements for all single crystalline materials in as few as 10 seconds. In this video, we reveal two measurement procedures, different to the conventional method, in Theta scan and Rocking Curves, and show the differences between them. The procedure is done with the help of the XRD Suite, both a powerful and intuitive software, making it convenient and easy to operate for a range of users.
Determining crystal orientation is crucial in semiconductor production. The Omega/Theta is the solution to accomplish this step quickly and accurately . This X-ray diffractometer comes with fully automated vertical three-axes and features such as mapping and stacking stages, rocking curve capabilities and many more. By combining the Azimuthal scan method with flexible sample handling, the Omega/Theta XRD can provide full measurements for all single crystalline materials in as few as 10 seconds. In this video, we reveal how the setup needed for the stacking stage looks like and also its measurement procedures. The procedure is done with the help of the XRD Suite, both a powerful and intuitive software, making it convenient and easy to operate for a range of users.
Determining crystal orientation is crucial in semiconductor production. The Omega/Theta is the solution to accomplish this step quickly and accurately . This X-ray diffractometer comes with fully automated vertical three-axes and features such as mapping and stacking stages, rocking curve capabilities and many more. By combining the Azimuthal scan method with flexible sample handling, the Omega/Theta XRD can provide full measurements for all single crystalline materials in as few as 10 seconds. In this video, we reveal how the setup needed for the mapping stage looks like and also its measurement procedures. The procedure is done with the help of the XRD Suite, both a powerful and intuitive software, making it convenient and easy to operate for a range of users.
The Crystal Orientation range is based on azimuthal scan, a smart geometrical measurement technique to orient crystals. It can determine both the tilt of the main crystal plane and the direction of the orientation flat or notch with speed and precision across wafers, boules, and single-crystal samples.
Your ultra-fast, top surface measuring crystal orientation in a compact package, able to measure any single crystal with a diameter between 2 mm and 300 mm. SDCOM uses the azimuthal scan method for fast, precise, and reliable orientation measurements in both lab and production settings.
The Omega/Theta is your reliable future-proof partner for determining crystal orientation in the fast-evolving semiconductor landscape. Market-leading precision, super-fast measurement times, and zero operator influence make it the go-to tool for semiconductor fabs and research labs. Thanks to the 3-axis goniometer geometry and integrated software intelligence, your orientation data is delivered fast and consistently.
Quick and precise crystal orientation measurement has never been so accessible – meet the SDCOM, your user-friendly compact XRD. The azimuthal scan method unlocks ultra-fast measurements with high precision for a wide range of single-crystal samples, while the compact footprint fits easily into your lab or production environment.