In semiconductor manufacturing and research, precision and speed are paramount for quality control. The Wafer XRD 200 is the ultimate X-ray diffraction system, providing ultra-fast, accurate crystal orientation measurements in just 10 seconds using the innovative Azimuthal scan method. This demo showcases the full capabilities of the Wafer XRD 200, including its fully automated sample handling, geometric feature recognition (notches, flats), and options for measuring resistivity, crystal lattice orientation, and more. Capable measuring all single crystalline materials, and processing up to 25 wafers in under 10 minutes, it seamlessly integrates into your production line with connectivity to MES and SECS/GEM interfaces. It offers reliable and in-depth measurements while maintaining low operating costs thanks to its energy-efficient air-cooled X-ray tube.
Product: Wafer XRD 200
Wafer XRD 200: Fast, precise and fully equipped, our solution for wafer end control
Wafer XRD 200 is your fully automated high-speed X-ray diffraction platform for wafer production and research. It provides key data on alignment, crystal quality, and wafer geometry with the speed and reproducibility needed for semiconductor manufacturing.