When speed, precision, and versatility matter, DDCOM brings crystal orientation analysis to a whole new level. This ultra-fast X-ray diffraction system delivers crystal orientation measurements all in a compact, portable format designed for both research and production environments. In this demo, we showcase how DDCOM determines full lattice orientation with unmatched speed and accuracy—thanks to its Azimuthal scan method and bottom-up measurement geometry, enabling reliable results in just a few seconds. With pre-programmed crystal recipes, DDCOM is ideal for controlling cutting, grinding, and lapping processes with precision as fine as 1/100°.
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