Product: Crystal Orientation

The Crystal Orientation range is based on azimuthal scan, a smart geometrical measurement technique to orient crystals. It can determine both the tilt of the main crystal plane and the direction of the orientation flat or notch with speed and precision across wafers, boules, and single-crystal samples.

Lars Grieger, segment marketing manager, presents an overview of metrology in single crystal manufacturing from raw ingot to finished wafer. He describes the market drivers in the semiconductor industry and relevant applications in academia. Lars explains the capabilities of newly acquired instruments and the role they play in crystal manufacturing metrology. He summarizes the accessories and optical capabilities that enhance the key benefits of the new instruments.