Product: Aeris

Grazing incidence X-ray diffraction (GIXRD) analysis is usually performed on thin film samples. To perform Grazing incidence diffraction on a compact X-ray diffractometer like Malvern Panalytical’s Aeris, you need a parallel beam set-up. Nicholas Norberg demonstrates exactly how this works. The quality of the data proves that Aeris is your partner for studying polycrystalline coatings, whether you need detailed studies of crystalline phases, or rapid high throughput quality control.

Transmission diffraction analysis is generally used for lowly absorbing materials to counteract the transparency effect in reflection measurements. This measurement type is typically performed on organic materials. Watch Nicholas Norberg demonstrate exactly how to measure powdered pharmaceutical samples with Malvern Panalytical’s Aeris, and be amazed by its versatility and the unique data quality.

Product manager Willijan Vissers presents the unique features of Aeris – the world’s first compact X-ray diffraction (XRD) system. These features include: a high-energy resolution detector technology, patented diffracted beam mask, and a semi-transparent beam stop. Willijan explains the benefits of each, from filtering out unwanted radiation in noisy environments, to enabling small-spot analysis by narrowing the beam slit or filtering out unnecessary parts of the spectrum.

Product manager Willijan Vissers introduces the world’s first compact X-ray diffraction (XRD) system – Malvern Panalytical’s Aeris. A high-performance instrument that’s much smaller than typical floor-standing XRD instruments, yet capable of versatile analysis at much lower power consumption. Willijan talks us through the cases where a compact instrument is the ‘happy medium’ between large-footprint instruments and less expensive ones that only carry out one kind of analysis.